IEC IEC 60749-38 Edition 1.02008-02 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory Dispositifs a semiconducteurs - Methodes d'essais mecaniques et climatiques - Partie 38: Méthode d'essai des erreurs logicielles pour les dispositifs a semiconducteurs avec memoire IEC 60749-38:2008 vithout license from IHS THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright @ 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEc copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below oryourlocal IEC member National Committee for further information. ni utilisee sous quelque forme que ce soit et par aucun procede, électronique ou mecanique, y compris la photocopie et les microfilms, sans I'accord écrit de la CEi ou du Comite national de la CEl du pays du demandeur. Si vous avez des questions sur le copyright de la CEl ou si vous desirez obtenir des droits supplementaires sur cette IEC CentralOffice 3, rue de Varembé CH-1211Geneva20 Switzerland Email:
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