IEC IEC60749-42 Edition1.02014-08 INTERNATIONAL STANDARD NORME INTERNATIONALE colour nside Semiconductordevices.-Mechanicalandclimatictestmethods- Part 42: Temperature and humidity storage Dispositifsasemiconducteurs-Methodesd'essaismecaniquesetclimatiques Partie42:Stockagedetemperatureet d'humidite IEC 60749-42:2014-08(en-fr Copyrighted materiall THIS PUBLICATIONIS COPYRIGHT PROTECTED Copyright2014IEC,Geneva,Switzerland either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Thomson et les microfilms, sans I'accord ecrit de I'IEC ou du Comite national de IIEC du pays du demandeur. Si vous avez des Reuters questions sur le copyright de I'lEC ou si vous desirez obtenir des droits supplementaires sur cette publication, utilisez les coordonnees ci-apres ou contactez le Comite national de I'IEC de votre pays de residence. (Scientific), IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varembe Fax: +41 22 919 03 00 CH-1211 Geneva 20
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